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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 15931.00 XOF
Availability: InStock

Product ID: 287271514

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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

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Trustpilot

TrustScore 4.5 | 7,300+ reviews

Anjali K.

The product quality is outstanding. Exactly what I needed for my work.

1 month ago

Anita G.

Good experience, but the tracking updates could be better.

2 months ago

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15931CFA

Duties & taxes incl.

Burkina Fasostore

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Trustpilot

TrustScore 4.5 | 7,300+ reviews

Sneha T.

Received my product in pristine condition. Great service overall.

1 month ago

Ayesha M.

The product exactly matches the description. Very satisfied with my purchase.

5 days ago

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